# Investigation of gross die per wafer formulas

@article{deVries2005InvestigationOG, title={Investigation of gross die per wafer formulas}, author={D.K. de Vries}, journal={IEEE Transactions on Semiconductor Manufacturing}, year={2005}, volume={18}, pages={136-139} }

Different forms of gross die per wafer formulas are investigated with respect to the accuracy in which they model the exact gross die per wafer count, as a function of die area and die aspect ratio. Coefficients are given with which the different formulas provide a sufficiently accurate model. To model the aspect ratio dependence, it is found that the mean of die width and die height should be used as a parameter.

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